Pan, Huayong is a Research Associate Professor  since 2016 and was an Assistant Researcher from Jan 2005 to July 2006 in the Key Laboratory for the Physics and Chemistry of Nanodevices and School of Electronics, Peking University. He is a Lecturer in Electron Microscopy Laboratory Institute of Physics, Peking University from Oct.2001 to Dec.2004; He was a Post-doctor researcher In Center for Integrated Research in Science and Engineering, Nagoya University from Nov.2002 to July 2004. He was a

Post-doctor in Electron Microscopy Laboratory Institute of Physics, Peking University from Oct. 1999 to Oct. 2001. He obtained his bachelor degree and master degree from University of Jilin in 1991 and 1994 respectively, and obtained his Ph.D. from Central Iron and Steel Research Institute, Beijing in 1999.

His research interests include Nano-Fabrication, Materials Physics and Electron Microscopy. Dr. Pan has published more than 50 research papers, and 41 papers are published in SCI index journals, such as nano letter, Appl, ultramicroscopy, scientific report, and nanotechnology. His paper was cited by other researchers with more than 1900 times. He Sponsored “Electron Microscopy Studies on Relationship of Microstructure and Physical Properties of Perovskites-like Structures” and acquired the grant of China National Natural Science Foundation. He was nominated as a Peer Reviewer of National Natural Science Foundation of China in 2002. Dr. Pan have taken part in two 973 programs, and three NSFC programs.

His research achievements are summarized as follows:

1) The Study of Coherent Electron Micro-Diffraction from a Single Translation Domain Boundary was studied; And the Study of Coherent Electron Micro-Diffraction in perfect crystal is also studied

2) Nanometer materials, such as nanotube (carbon and TiO2), III-V nanowire (InAs, InSb, InGaAs, InGaSb), nanowire (ZnO, tungsten oxide, silicon, GaN, Silicon Carbide), Trimolybdate Nanowires, Clusters (FePd, FePt, Vanadium, ZnS), nanoparticle (YBaCuO, TiO2), CdS nanoring, CdS Quantum Dots etc., were characterized by electron microscopy.

3) Thin film materials, such as Superconductivity YBa2Cu3O7, Double-perovskite Sr2FeMoO6 epitaxial films, FePt thin ?lms by Ta and Ta/Bi buffer layers,Co/Native Oxide/Pt Multilayers, SiO(2)/Fe-Pt/SiO(2) sandwich structure films, Mo/CoFeB/MgO trilayers and etc. were characterized by electron microscopy.

All these characterization of microstructure was strong support to next work, such as, synthesis, measurement of physics property, nanofabrication.